| Abstract:A general test system for weapon electronic component products is developed. Through secondary development, the test interface and test flow can be customized for different test tasks, reducing hardware resources and shortening test development cycle. The hardware platform is built with an open, extensible/tailored overall architecture, and the design and development of the general test system software is completed with virtual instrument technology, script technology, programming language technology and layered software architecture. The functional command set and script development tools are designed to meet the requirements of test development, and a relatively complete command-driven system is built, which achieves the purpose of self-defining test flow and shortening the development cycle of test programs. Through different experiments, the general test system can complete the test tasks of different weapon electronic components. It has good versatility, flexibility and scalability, and can be applied to the test of various weapon electronic components in the military factory for a long time. |
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